* 1000HZ 3 axis vibration test bench

Vibration test bench aye looi në defense, aviation, communication, electronics, automobile, home appliances, ku jɔl ya luɔɔi wɛrɛw peei. Kä ye kek looi aye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈u në luɔɔi de kä ye kek tɔ̈ Sinus wave, modulation, sweeping frequency, programmable, multiplex, logarithm, time control.

5. Luɔi

Sinus wave, modulation, sweeping frequency, programmable, multiplex, logarithm, time control

Features: A lëu bï ya luui në dhöl 6 ye töŋ, ku a lëu bï ya tɔ̈ɔ̈u në dhöl juëc

Ajuiɛɛr de wɛ̈ɛ̈r: [në Class I ku A/20OHZ]. [Tɛ̈n II ku tɛ̈n B/50OHZ]. [Third and Type C/5000HZ within] - Sinus Wave (Half Wave or Full Wave) Test Conditions [Third and Type C/5000HZ within] - Sinus Wave (Half Wave or Full Wave) Test Conditions [Third and Type C/5000HZ within] - Sinus Wave (Half Wa

Kä ye kɛ̈ɛ̈r V & VI (Kä ye kɛ̈ɛ̈r: A ~ F) 60OHZ & 5000HZ]---Kä ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

Lɔ̈ɔ̈i: [në I ku A/20OHZ]. [Tɛ̈n II ku tɛ̈n B/50OHZ]. [III ku C/500OHZ] - Sinus wave (half wave ka full wave) test conditions

[Test condition V and VI (test condition letter: A ~ F grade) 60OHZ and 3000HZ within] --- random vibration: power spectrum density test conditions

Logarithms: [në I ku A/20OHZ]. [Tɛ̈n II ku tɛ̈n B/50OHZ]. [III ku C/500OHZ] - Sinus wave (half wave ka full wave) test conditions

[Test condition V and VI (test condition letter: A ~ F grade) 60OHZ and 3000HZ within] --- random vibration: power spectrum density test conditions

Tɛ̈ɛ̈r lëu bï ya looi [në I ku A/20OHZ]. [Tɛ̈n II ku tɛ̈n B/50OHZ]. [III ku C/500OHZ] - Sinus wave (half wave ka full wave) test conditions

[Test condition V and VI (test condition letter: A ~ F grade) 60OHZ and 3000HZ within] --- random vibration: power spectrum density test conditions

Frequency: [në Class I ku Class A/20OHZ]. [Tɛ̈n II ku tɛ̈n B/50OHZ]. [III ku C/200OHZ] - Sinus wave (half wave ka full wave) test conditions

[Test conditions V and VI (test condition letter: A~F grade) within 60OHZ and 5000HZ] --- random vibration: power spectrum density test conditions.

* 1000HZ 3 axis vibration test bench

Kompyuta/Printing (Control/Storage/Recording/Printing) (485 Communication Interface: Computer-controlled)

A lëu ba waveform/frequency/time ye tïŋ, a lëu ba kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc

Modulator/programmable/multiplex/logarithm, lëu bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u

A lëu bï ya looi jump frequency / amplitude tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u

Research department or unit can test several modules simultaneously combination/automatic time/repeatable (Dɛ̈ɛ̈r de puɔ̈ɔ̈c wala unit lëu bï module juëc ya them në kaam tök)