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8 inch Olympus wafer inspection system
8 inch Olympus wafer inspection system can correspond to 200mm below the wafer size of silicon, compound wafers, and can also safely and effectively t
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8寸奥林巴斯晶圆检查系统

8 inch Olympus Wafer Check System Features

● A ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye

●8 inch Olympus wafer inspection system transfer various sizes of silicon flakes

Në ye mɛn, AL120 series wafer inspection system ee mɛn 3 ye kek looi, ye 200mm (AL120-L8), 150mm ku 200mm ye kek looi (AL120-L86), 150mm ka tɔ̈u (AL120-L6). A looi bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i b Macro-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈

晶圆检查系统传输各种尺寸的硅片

● 8 inch Olympus wafer inspection system can transfer ultra thin silicon sheets, i.e. thin to 90um

Walasa ka kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye A lëu ba kunnafoniw 10 ye kek looi në silicon ye kek looi në panel yic.

● Ability precision, improve the function of macro inspection

Masin yam ye macro-check (LMB) ye rot 360 degrees ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot ye rot Kë ye looi bï kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈ Ka fara o kan, a lëu bï silicon tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n t

晶圆360°检测显微镜

●LCD ye nyuɔɔth bï ya tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë

LCD ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ Aw ye tɛmɛ, ka tɛmɛ macro ku micro ye tɛmɛ, ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.

晶圆检查系统LCD显示屏

● Tɛmnɛɛr tɛmnɛɛr

Në kë de gël de silicon ye, AL120 series wafer inspection system ee silicon ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ. Ajuiɛɛr ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ

● Mikroskop ye duniŋ ku ye gam

Olympus Semiconductor Inspection Microscope MX61 ee fotow ye nyuɔɔth në biäk juëc yiic, ye nyuɔɔth në biäk juëc yiic, ye nyuɔɔth në biäk juëc yiic, ye nyuɔɔth në biäk juëc yiic, ye nyuɔɔth në biäk juëc yiic, ye nyuɔɔth në biäk juëc yiic. Equipped with electric lens turning disk, with the microscope host's aperture luminance has a connecting function, each time the lens is switched, the aperture luminance will also automatically change.

● Luɔi SEMI S2/S8 ku RoHS

AL120 series wafer inspection system designed to not only focus on the safety of the transmission of silicon chips, but also to guarantee the safety of the operator, fully compliant with SEMI's S2 and S8 standards, and also compliant with Rohs standards.

8 inch Olympus wafer inspection system technical specifications

Model

AL120-LMB12-LP

AL120-LMB12-F

Wafer size

300 mm (SEMI M1.15 t=775 μm) lëu bï ya kuanycök: 200 mm

Namba karton

Boks tök (Load, unload)

Height setup cartridge

900 mm

Load port

Yïn

Wala

Order de manipulation

Makro, Makro, Mikroskop

Checking Mode

Kuen fɛɛr, kuen sampol

Wafer kalibrasiɔn

Ring sentral non-contact

Wafer Handling

Mechanical handling of vacuum adsorption

Mikroskop luɔi

Mikroskop ye tïŋ semikonduktor MX61L

Application Environment (Applying Environment) (Applying Environment) (Applying Environment) (Applying Environment) (Applying Environment) (Applying Environment)

AC100~120 V,220~240 V,3.0/1.7 A,50/60 Hz , Vacuum-67~-80 Kpa

Kargo

XY manual adsorption carrier table, with XY rough/fine tuning and 360 degree rotating mechanism. XY manual adsorption carrier table, with XY rough/fine tuning and 360 degree rotating mechanism. XY manual adsorption carrier table, with XY rough/fine tuning and 360 degree rotating mechanism.

Kɔɔr (wala mikroskop)

360 kg

270 kg

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