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Mikroskop fuu atomik ye rot looi AFM5500M
AFM5500M ee tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë t Equipment offers a fully a
Detalji proizvoda
Mikroskop fuu atomik ye rot looi AFM5500M
AFM5500M ee tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë t Equipment offers a fully automatic operation platform in the suspension arm replacement, laser pair, test parameter setting and other links. Equipment offers a fully automatic operation platform in the suspension arm replacement, laser pair, test parameter setting and other links. Sɛnɛɛr kura ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ Ku, tɛ̈n yenë SEM-AFM ya tɔ̈ɔ̈u thïn, a bɛ̈n ya cɔk loi rot bï a tïŋ ka tïŋ ka tïŋ ka tïŋ ka tïŋ ka tïŋ ka tïŋ.
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Ajuiɛɛr ye looi: Hitachi High-tech Science
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Karakteristika
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Parameters
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Movie
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Data Application
Karakteristika
1. Automation function
- Automation function ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye
- Lɔ̈k kä ye raan looi në tɛ̈n yenë yen yök
4 inch otomatik motor
Automatic Replacement Arm Function
2. Gɛɛl
Ka bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i
- Skan horizontal ye dït
- Atomic force microscope ye tɔ̈u në tube scanner, ye tɔ̈u në curve surface ye tɔ̈u në scanner arc movement, ye tɔ̈u në software correction. Nka, software ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ
AFM5500M ee tɔ̈u në scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner ye cɔl horizontal scanner.
Sample ：Amorphous silicon thin film on a silicon substrate
- Angular measurement
- Scanner ye tɔ̈u në mikroskop atomik ye tɔ̈u në ye mɛn, a bɛ tɔ̈u në ye mɛn, a bɛ tɔ̈u në ye mɛn, a bɛ tɔ̈u në ye mɛn, a bɛ tɔ̈u në ye mɛn. O ye sabab ye fotow ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
AFM5500M ye scanner yam ye tɔ̈ɔ̈u në yen, ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u
Sample : Textured-structure solar battery(having symmetrical structure due to its crystal orientation.)
- * Tɛ̈n yenë AFM5100N (Open Loop Control) luɔ̈ɔ̈i thïn
3. Kɔmpiye
Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ
Ka tɛmɛ SEM-AFM, a bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ
SEM-AFM ye tïŋ në tɛ̈n töŋ (cïmën: graphene/SiO)2）
The ovrlay images createed by using AZblend Ver.2.1, ASTRON Inc.
Foto dɔ ye foto dɔ ye AFM5500M ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ ye foto dɔ.
- Ka tɛmɛ AFM fotow ye tɛmɛ, SEM contrast ye graphene layer ye tɛmɛ.
- Graphene layers ye tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈
- SEM fotow ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye
Lɔ̈ɔ̈m bɛ̈n looi bï kek ya luui në mikroskop wɛrɛw yiic ku jɔl ya analytic instruments.
Parameters
| Motor | Otomatik Precision Motor Table Yïïn ye tïŋ: 100 mm (4 inch) bɛ̈ɛ̈i Kɔl ye rot looi: XY ± 50 mm, Z ≥21 mm Lɔ̈ɔ̈m dɔ̈ŋ: XY 2 µm, Z 0.04 µm |
|---|---|
| Maksimum Sample Size | Diameter: 100 mm, Thickness: 20 mm Sample weight: 2 kg |
| Scan Range | 200 µm x 200 µm x 15 µm (XY: Ajuiɛɛr ye cɔl closed loop / Z: Ajuiɛɛr ye cɔl sensor monitoring) |
| RMS noise level* | 0.04 nm ka tɔ̈u (High Resolution Mode) |
| Re-setup accuracy* | XY: ≤15 nm (3σ, ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye |
| XY tɛɛr | ±0.5° |
| BOW* | 2 nm/50 μm |
| Metode deteksyon | Laser detection (low interference optical systems) (Laser detection) (Laser detection) (Low interference optical systems) (Laser detection) (Low interference optical systems) (Laser detection) (Low interference optical systems) |
| Mikroskop optik | Luɔi: x1 ~ x7 Kä ye tïŋ: 910 µm x 650 µm ~ 130 µm x 90 µm Wël ye nyuɔɔth: x465 ~ x3,255 (27 inch) |
| Damping station | Kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr |
| Anti-sound | 750 mm(W) x 877 mm (D) x 1400 mm(H)、 237 kg |
| Size/Weight | 400 mm（W） x 526 mm（D） x 550 mm（H）、 90 kg |
- * Parameters be kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l.
| OS | Windows7 |
|---|---|
| RealTune ® II | Automatic adjustment of arm amplitude, contact force, scanning rate and signal feedback (Lɔ̈ɔ̈m de arm amplitude, contact force, scan rate, ku signal feedback) |
| Taswira Kuen | Navigation function, multi-window display function (test/analysis), 3D image overlay function, scanning range/measurement resume display function, data batch processing analysis function, probe evaluation function |
| X, Y, Z scan drive voltage | 0～150 V |
| Tɛm wakat (piksel) | 4 fotow (maximum 2,048 x 2,048) 2 foto (maximum 4,096 x 4,096) |
| Sken rectangular | 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1 |
| Software analitik | 3D display function, roughness analysis, section analysis, average section analysis |
| Funksiɔn Kontrol Otomatik | Awtomatik waar arm, awtomatik laser pair |
| Size/Weight | 340 mm（W） x 503 mm（D） x 550 mm（H）、 34 kg |
| Power | AC100 ~ 240 V ±10% AC |
| Test Mode | AFM, DFM, PM, FFM LM-FFM、VE-AFM、Adhesion、Current、Pico-Current、SSRM、PRM、KFM、EFM（AC）、EFM（DC）、MFM |
- * WINDOWS ee Microsoft Corporation ye looi në United States ku bɛ̈ɛ̈i kɔ̈k peei.
- * RealTune ee tɛ̈n yenë kɔc cɔl Hitachi High-tech Science Corporation looi në Japan, United States, ku Europe.
| Hitachi SEM model ye luɔɔi | SU8240, SU8230 (H36 mm), SU8220 (H29 mm) |
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| Sample Table size | 41 mm（W） x 28 mm（D） x 16 mm （H） |
| Maksimum Sample Size | Φ20 mm x 7 mm |
| Precision ye | ±10 µm (AFM ye kɔc cï gam) |
Movie
Data Application
- SEM-SPM ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam ye kaam2(PDF, 750kBytes)
Data Application
Lɩzɩ tʋmɩyɛl microscope scanning probe data.
Bayan
A bɛ fɛɛrɛ wɛ̈ɛ̈r ye cɔl Scanning Tunnel Microscope (STM) ku Atomic Force Microscope (AFM).
Tarih ku SPM
A leŋ tɛ̈n bɛ̈n tɛ̈n bɛ̈n tɛ̈n bɛ̈n tɛ̈n bɛ̈n tɛ̈n bɛ̈n tɛ̈n bɛ (Global site)
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