** Reflection rate of target film, high precision measurement of film thickness and optical constants. A ye kë ye cɔl a ye kë ye cɔl a ye kë ye cɔl a ye kë ye cɔl a ye kë ye cɔl a ye kë ye cɔl Non-contact · Non-destruction · Microscopy

A tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n

Optical Differential Film Thickness Meter (OPTM series) ye tɔ̈u në microspectrometry bï ya tɛmɛ në ɣän koor yiic në ** reflectivity, bï ya tɛmɛ në thickness film / optical constant analysis. A ye tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ Tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen t

Karakteristika produk:

• Head integrates functions needed to measure thin film thickness (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye)

• Kuen de kä ye kek tïŋ në microspectroscopy** de kä ye kek tïŋ në microspectroscopy de kä ye kek tïŋ në microspectroscopy de kä ye kek tïŋ në microspectroscopy de kä ye kek tïŋ në microspectroscopy

• 1:1 seconds High Speed Measurement

• Optical System (UV*** Near Infrared)

• Mechanisms of security for regional sensors (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors)

• A ye raan cɔl Easy Analysis Wizard, a ye raan ye daminɛ bɛ̈n lëu ba optical constant analysis looi

• Kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc

• A kony kɔc juëc

Kä ye them:

• ** Reflectivity measurement

• Multilayer membrane analysis

• Optical constant analysis (n: refractive rate, k: dimming coefficient) (n: refractive rate, k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient)

Application: Luɔi:

• Semiconductor: Automatic adjustment of wafer samples, wafer bending detection

• Optical components: lens lens radiation, bending etc. detection

Model Specifications：