Bayan Produk
Karakteristika
Head integrates functions needed to measure thin film thickness (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye)
Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t
1:1 seconds High Speed Measurement
Optical systems in wide range under differential light (ultraviolet to near infrared) (Optical systems in wide range under differential light) (Ultraviolet to near infrared) (Optical systems in wide range under differential light)
Mechanisms of security for regional sensors (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors) (Mechanisms of security for regional sensors)
A ye raan cɔl Easy Analysis Wizard, a ye raan ye daminɛ bɛ̈n lëu ba optical constant analysis looi
Kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc
A kony kɔc juëc
|
OPTM-A1 |
OPTM-A2 |
OPTM-A3 |
| Wave Length Range |
230 ~ 800 nm |
360 ~ 1100 nm |
900 ~ 1600 nm |
| Film thickness range |
1nm ~ 35μm |
7nm ~ 49μm |
16nm ~ 92μm |
| Waktu |
1 sekond / 1 point |
| Size of Spot |
10μm (ye cɔl 5μm) |
| Sensor ye |
CCD |
InGaAs |
| Specifications ë Light Source |
Leum deuterium + leum halogen |
Lampu halogen |
| Power Specifications |
AC100V±10V 750VA (Automatic Sample Table Specification) |
| Size |
555(W) × 537(D) × 568(H) mm |
| Weight ye |
55 kg ((Bɛ̈ɛ̈r de Automatic Sample Table Specification） |
Kä ye them:
Ajuiɛɛr de reflexion absolu
Multilayer membrane analysis
Optical constant analysis (n: refractive rate, k: dimming coefficient) (n: refractive rate, k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient) (k: dimming coefficient)
Cäät kä ye them:
SiO 2 SiN [FE-0002]
Transistor ye semiconductor ye signal tuɔ̈ɔ̈c ka tɛmɛ yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen SiO 2 (silicon dioxide) wala SiN (silicon nitride) lëu bï ya luɔ̈ɔ̈i në film ye kɔnɔ. SiO 2 aye luɔ̈ɔ̈i ke ye insulation film, ku SiN aye luɔ̈ɔ̈i ke ye insulation film ye dielectric constant ye kɔ̈k ye SiO 2, wala ke ye barrier layer ye SiO 2 nyaai në CMP. O kɔrɔ, SiN cï bɛ̈n yiic. Walisa ka tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ
Lɔ̈ɔ̈i ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr
A tɛ̈n yenë LCD ye nyuɔɔth ye, a tɛ̈n yenë a nyuɔɔth ye, a tɛ̈n yenë a nyuɔɔth ye, a tɛ̈n yenë a nyuɔɔth ye. CF tɩŋa RGB pixel tök, kuru a ye biir koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom koom. Në luɔɔi de CF membrane, ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi Në ye mɛn, na ye kë ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color resistant ye cɔl color
Thickness of hard coated film measurement [FE-0004] Thickness of hard coated film measurement [FE-0004] Thickness of hard coated film measurement [FE-0004] Thickness of hard coated film measurement [FE-0004]
Në run juëc cï lɔ̈ɔ̈m yiic, ka baara ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye k Ka tɛmɛ yen, a ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛm O kama, a wïc ba HC layer's membrane thickness ya tɔ̈ɔ̈u.
Tɛ̈n yenë kë ye cɔl membrane thickness measured on surface roughness [FE-0007]
Na ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan A cɔl SiN (silicon nitride) ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye.
Filter interference measurement using a hypergrid model [FE-0009] Filter interference measurement using a hypergrid model [FE-0009] Filter interference measurement using a hypergrid model [FE-0009] Filter interference measurement using a hypergrid model [FE-0009]
Na ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan A cɔl SiN (silicon nitride) ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye.
Kä ye kek tɔ̈ɔ̈u në EL ye kek tɔ̈ɔ̈u në kë ye kek tɔ̈ɔ̈u në kë ye kek tɔ̈ɔ̈u në kë ye kek tɔ̈ɔ̈u në kë ye kek t
Organic EL materials are vulnerable to oxygen and moisture, and they can rot and damage in normal atmospheric conditions. Organic EL materials are vulnerable to oxygen and moisture, and they can rot and damage in normal atmospheric conditions. Organic EL materials are vulnerable to oxygen and moisture, and they can rot and damage in normal atmospheric conditions. Ku yɔɔdɔ, a wajib a tɔ̈ɔ̈u në gɛlɛɛr yic ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u. Kɔn ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ Glass ku jɔl ya air layer ye tɔ̈u në non-interference layer model.
Lɔ̈ɔ̈m de ultra thin nk ye ŋic ye tɔ̈u në multi-point identical analysis [FE-0013]
Walisa ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ Nka, n'a ye dɛ ye 100 nm wala a tɔ̈ɔ̈u, dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈r dɛ̈ɛ̈
Thickness of a substrate is measured with an interface coefficient [FE-0015] Thickness of a substrate is measured with an interface coefficient [FE-0015] Thickness of a substrate is measured with an interface coefficient [FE-0015]
Na ye substrate ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈ Ku në luɔɔi de interfaces coefficients, sabu a tɛ̈n yenë reflectivity ye dɔɔr në substrate surface yic, a lëu ba film ye dɔɔr në substrate yic ya them. Cït misal, a nyuɔɔth misal ye tɛ̈n yenë kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc.
DLC coating thickness measurement for various uses (DLC coating thickness measurement for various uses) (DLC coating thickness measurement for various uses) (DLC coating thickness measurement for various uses)
DLC (diamond-like carbon) ye carbon-based material ye kɔnɔ. A tɛ̈n luɔ̈ɔ̈i në luɔɔi juëc ye, dalil ye a tɛ̈n yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen Saan juëc cï looi yiic, a wïc bï a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n
A tɛ̈n yenë yen looi aye DLC ye tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen Otsuka Electronics ye optical interference membrane thickness meter tɔ̈u yen, a bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ. Ka tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Ka tɛmɛ microscope optical system, ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ Ku dɛ̈t peei, tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ
A bɛ kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l A tõe tɛmɛ zĩ-kɛɛl juëc ye kɔɔrɔ.
Optical interference membrane thickness system's weakness is not possible to perform a precise membrane thickness measurement if you do not know the optical constant (nk) of the material, which Otsuka Electronics has confirmed by using a unique analysis method: multi-point analysis. A lëu ba tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈ Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ
A kɔɔr cɔl NIST (National Institute of Standards and Technology) ye kɔɔr cɔl standard sample ye kɔɔr cɔl standard sample ye kɔɔr cɔl standard sample ye kɔɔr cɔl standard sample.
