Oxford Thickness Meter

Instrument Introduction:

CMI900 fluorescent X-ray coating thickness gauge, with non-destructive, non-contact, rapid non-destructive measurement, multi-layer alloy measurement, high productivity, high reproducibility etc. has a wide range of applications from quality management to cost saving. CMI900 fluorescent X-ray coating thickness gauge, with non-destructive, non-contact, rapid non-destructive measurement, multi-layer alloy measurement, high productivity, high reproducibility etc. has a wide range of applications from quality management to cost saving.

Luɔi:

Kɔn ye luui në electronic components, semiconductors, PCB, FPC, LED brackets, auto parts, functional electroplating, decorative parts, connectors, terminals, bathroom cleaners, jewelry accessories ... në luɔɔi juëc yiic de surface coating thickness;

A tɛmɛ a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye a ye

Karakteristika:

Kä ye kek them, kä ye kek them: Ti22<unk>U92;

A lëu bï 5 layers/15 elements/coexisting elements ya tɔ̈ɔ̈u në kaam tök.

A tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n

Statistics data, processing function;

NIST cï gam;

Luɔi ku kony duniɛ kɔnɔ.

Parameters:

1.X-ray stimulation system

Sistem optik X-ray ye cɔl vertical downlight

Air cooled micro-focus type X-ray tube, Be window

Target standard: Rh target; Ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan

Puɔth: 50W ((4-50kV, 0-1.0mA)

A cɔl safety anti-ray gate

Filtr X-ray ye rou: 3 ye yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen

2. Sistem rectifier

Single Straightener Components, Multi Straightener Automatic Control

Components: Up to 6 specifications rectifiers can be assembled simultaneously

Kuen juëc ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam ye kek gam:

- Round, cït mɛn 4, 6, 8, 12, 13, 20 mil, etc.

Walisa 0.102, 0.152, 0.203, 0.305, 0.330, 0.508mm

- Rectangular, cït 1x2, 2x2, 0.5x10, 1x10, 2x10, 4x16mil, etc.

O ye 0.025*0.05, 0.05*0.05, 0.013*0.254, 0.025*0.254, 0.051*0.254, 0.102*0.406mm

Tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n

3. Sample Room

Sample room sample table size larger 610mm x 610mmXY axis moving range standard: 152.4 x 177.8mm<process control> Z axis control moving height 43.18mmXYZ axis control method multiple control methods optional: XYZ three axis program control; XY axis manual control ku Z axis program control; XYZ 3 axis manual control

4. Sample observing system

CCD ye tïŋ në luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi 50 ku 100 ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n. Laser Auto Focus Function Can Zoom Distance Control Function And Fixed Focus Distance Control Function Computer System Configuration IBM Computer

HP wala Epson Color Inkjet Printer Analysis Software Operating System: Windows XP Chinese Platform Analysis Software Package: SmartLink FP Software Package

5.Thickness Range

A tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yen

Basic analytics function is corrected using basic parameter method. Basic analytics function is corrected using basic parameter method. Basic analytics function is corrected using basic parameter method. Basic analytics function is corrected using basic parameter method. Oxford Instruments abï käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke

Sample suguya: coating; Kä ye kek yök: Ti22 <unk> U92; A lëu bï 5 layer/15 element/coexisting element correction ya tɛmɛ në kaam tök. Kuen metal ye kɔnɔ, cït mɛn Au karat; Analyze of materials and alloys elements (Analyze of materials and alloys elements) (Analyze of materials and alloys elements); Kuen de kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u;

Spectrum de samples ka 4 ye nyuɔɔth ka tɛmɛ; Analysis de spectrum qualitatif de kä ye kek looi. Ajuiɛɛr ku jɔl ya luɔɔi

System automatic adjustment and correction function, automatic elimination of system drift measurement automation function mouse activation measurement mode: "Point and Shoot" multi-point automatic measurement mode: random mode, linear mode, gradient mode, scanning mode, repeat measurement mode

Ajuiɛɛr de tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ

Tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈ CP、CPK、 Control upper limit chart, control lower limit chart optional software: Statistical Report Editor lets users customize multimedia reports, data groups, X-bar/R charts, histogram database storage functions. Control upper limit chart, control lower limit chart optional software: Statistical report editor lets users customize multimedia reports, data groups, X-bar/R charts, histogram database storage functions.

System security monitoring function, Z axis protection sensor, sample room door opening and closing sensor