WBE Rapid Temperature Change Test Box：

1.Applied to electronic and electrical products environmental stress screening (ESS) test, and in temperature or gradient conditions for testing parts temperature stress detection, temperature and humidity screening, reliability testing, performance testing, weather resistance testing, high and low temperature storage etc. 1.Applied to electronic and electrical products environmental stress screening (ESS) test, and in temperature or gradient conditions for testing parts temperature stress detection, temperature and humidity screening, reliability testing, performance testing, weather resistance testing, high and low temperature storage etc.

2.Products satisfy temperature setting changes (linear lift cooling method) and non-linear lift cooling. 2.Products satisfy temperature setting changes (linear lift cooling method) and non-linear lift cooling. 2.Products satisfy temperature setting changes (linear lift cooling method) and non-linear lift cooling.

3.Ka 5 ~ 30 ℃ / min tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

4.Can customize (humidity) test requirements to meet 150L to 4600L standard volume and other models non-standard customization

Lappol:

Semiconductor chips, universities, quality inspection, new energy, photoelectric communication, aerospace military industry, automotive industry, LCD display, medical and other science and technology industries. Kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta ye kɔmpiyuta

An bɛ yïn gäm tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye t

Ba wël wɛ̈t kɔ̈k yök, yɔ̈ɔ̈r 139-2290-2928

1. Litre cooling rate optional:5~30℃/min；

2.Product adopts one-in-one box design, structure is more reasonable and compact. 2.Product adopts one-in-one box design, structure is more reasonable and compact. 2.Product adopts one-in-one box design, structure is more reasonable and compact.

3.Adopting electronic expansion valve technology and innovative control system, products efficient energy saving. 3.Adopting electronic expansion valve technology and innovative control system, products efficient energy saving. 3.Adopting electronic expansion valve technology and innovative control system, products efficient energy saving.＞30%；

4.All life cycle system monitoring, multiple protection, maintenance is easy. 4.All life cycle system monitoring, multiple protection, maintenance is easy. 4.All life cycle system monitoring, multiple protection, maintenance is easy. 4.All life cycle system monitoring, multiple protection, maintenance is easy.

1.Can customize (X: linear, F: non-linear) lift cooling method according to demand. 2. Humidity lëu.

A, tɛ̈n yenë test criteria：

GB/T 2423.1 Wɛ̈t ye kɔɔr tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r

GJB 150.3 Tɛɛr tɛɛr

GB/T 2423.2 Metode de test de température élevée

GJB 150.4 Tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

GB/T2423.34 Fɛɛrɛ de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr de tɛɛr

GJB 150.9 Tɛɛr ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

IEC60068-2 Tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

MIL-STD-202G-103B wɛ̈ɛ̈r ye cɔl humidity test

II. Kä ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k：

IEC-60749-25: Semiconductor Devices - Temperature Cycle

IEC-60068-2-14 Nb: Kɔc ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë

IEC-61747-5: Liquid Crystal and Solid State Display Equipment - Environmental, Durability and Mechanical Testing Methods (Kä ye kek tïŋ në ɣän kɔ̈k yiic, ku jɔl ya kä ye kek tïŋ në ɣän kɔ̈k yiic)

JESD22-A105-C: Solid State Devices, Testing Quality and Reliability Power and Temperature Cycles

SAE-J1211: Kä ye kek looi në ɣän kɔ̈k yiic - Kä ye kek looi në ɣän kɔ̈k yiic

IPC-9701: Kuen de tɛm de luɔɔi de kä ye kek looi në luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi