Ajuiɛɛr
Low PowerXRadiation de ray tube ye fluorescence radiation de atom de sample analyzed. Radiation ye cɔl sample ye bɛ̈n tɔ̈ɔ̈u ka bɛ̈n tɔ̈ɔ̈u ka bɛ̈n tɔ̈ɔ̈u ka bɛ̈n tɔ̈ɔ̈u. Radiation fluorescent de sulfur (SKα(Reflected in a fixed angle, and detected through a gas positive counter) (Reflected in a fixed angle, and detected through a gas positive counter) (Reflected in a fixed angle, and detected through a gas positive counter) (Reflected in a fixed angle, and detected through a gas positive counter) Radiation ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye.
Kä ye yök aye tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u. A lëu bï ya tɔ̈ɔ̈u në tɛ̈n yenë a tɔ̈ɔ̈u në tɛ̈n yenë a tɔ̈ɔ̈u në tɛ̈n yenë a tɔ̈ɔ̈u thïn.
Ø Karakteristik
Ø Sulfur measurement range–Ka taa 3 ppm;
Ø Low yeLimit detection – 1 ppm;
Ø High Performance – Sample bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i3minit;
Ø Ka tɛmɛ diametersXRay Optical Circuit, lëu bï ya looirepeatability;
Ø 2Modèle de mesure:
- Vacuum Room-Sample analysis aye looi në ɣän ye kek tɔ̈ɔ̈u në ɣän ye kek tɔ̈ɔ̈u në ɣän ye kek tɔ̈ɔ̈u në ɣän ye kek tɔ̈ɔ̈u në ɣän ye kek tɔ̈ɔ̈u në ɣän ye kek tɔ
- Helium bɛ̈ɛ̈r<unk> ye gamASTMStandart;
Ø Touch ScreenKɛ interface ye kɛ raan ye luɔ̈ɔ̈i;
Ø Built-inKontrol kɛnɛ luɔɔiKalkulator;
Ø A lëuBuilt-inPrinterPrint Report;
Ø LuɔiEasy, luɔɔia gam;
Ø GɛlɛSample ye tɔ̈ɔ̈u në analyzer yic;
Ø Automatically compensate effects of other elements, reducing (Kɔɔr ye kä wɛrɛ looi)Analyze errorYe.
Ø Specifications
Parameters |
Limba |
Sulfur content measurement range,Unit:ppm |
3 –50 000 |
600Limit de statistique de détection de secondes,Unit:ppm |
1 |
Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: Limits of measurement error: • Ka 3 ppmKa60 ppm: • Ka60 ppmKa50 000 ppm: Ɣän,C=Kuen sulfurYe. |
ΔC = ±(1.6642+0,0584*C; ΔC = ±0.18*C0.818 |
General Relative Measurement Error Limit, Units (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye)% |
0,5 |
Kɔl gamP = 0.95Kë lëu bï ya looi në kaam de luɔɔi ye kek looi: • Ka 3 ppmKa60 ppm: • Ka 60 ppm Ka600 ppm: • Ka 600 ppm Ka50 000 ppm: Ɣän,C=Sulfur mass fractionYe. |
r = 1.7+ 0.0248*C; r = 4; r = 8 + 0.0188*C. |
Kuen molybdenum, unit:imp. / Sec |
>8 000 |
Kɔnɔŋ (kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ kɔnɔŋ) |
> 100 |
Power |
220±22 V,50±1 Hz |
Energi tɔ̈u |
250 V-A |
Dimensions of appearance (length × width × height) ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋ ye dɔŋmm |
450×400×415 |
Weight,kg |
45 |
Wakat cïï bɛ̈n looi, unit: hours |
Ka tɔ̈u16 000Saat |
Lifetime average, unit: run |
Ka tɔ̈u10Saan |
Ø Software
A lëu bï analyzer ya tɔ̈ɔ̈u ku ya tɔ̈ɔ̈u në touchscreen yic, ku a lëu bï kä ye kek them ya tɔ̈ɔ̈u. Software ye tɔ̈u në thoŋ Inglis.
ASW-2Software ye baara:
- Yök wala looi operator yam;
- Aw bɛ model de mesure kuanycök;
- Lɔ̈k wala lɔ̈k paramètres de instrument;
- Lɔ̈k kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ;
- Print a report of measurement or a spectrum (Lɔ̈ɔ̈m de kä ye kek them wala kä ye kek them)
- Analyze samples ye sulfur tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u.
X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer X-ray wavelength spectrum analyzer