glavni
Instrument i metar
Perkin Elmer infrared spectrometer
SCS Ion Pollution Machine
Nikon VMA-4540
Nordson DAGE X-ray Transmission Detection System
V Cut Thickness Measurer
UV-3600Plus
Seymour iCP-7200 Inductive Coupled Plasma Emission Spectrometer
Swiss Vantong Automatic Sampling Titration System
IC-8610 Ion Chromatographer
UV spectrophotometer U-39003900H
X-ray fluorescence analyzer EA1000AIII
Hitachi Thickness Meter
Oxford Thickness Meter
Fischer thickness gauge ye luɔɔi
Thickness Meter ye lu??i
Sonde copper SRP-4
ETP copper probe
Standard Thickness Meter
Oxford X-ray Tub
CMI900X-Strata920 detektor
CMI900X-Strata920 High Voltage Power Supply
Mikroskop Nikon
Mikroskop ye cɔl MX6RT
Olympus BX53
Ultrasonic Image Device FineSAT III
Uspješna operacija!